This is accomplished by connecting all of the design's registers in serial fashion, allowing test engineers to shift data in and out through a few ports at the chip level (Fig. 1). That allows, for ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

New manufacturing test challenges are raised with SoC technology advances where both test quality and test costs are affected with a direct impact on current Design-For-Test (DFT) methodologies and ...

Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.

ALLENTOWN, PA—Developing an effective design and test strategy for an IC can be a daunting task. At Agere Systems, the difficulties are magnified because the company produces hundreds of distinct ...

Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...

Join us on Wednesday, December 15 at noon Pacific for the Design for Test Hack Chat with Duncan Lowder! If your project is at the breadboard phase, or even if you’ve moved to a PCB prototype, it’s ...